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1

[IEEE 2004 IEEE International Symposium on Circuits and Systems - Vancouver, BC, Canada (23-26 May 2004)] 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512) - Error-resilient transcoding using adaptive intra refresh for video streaming

Hong-Jyh Chiou,, Yuh-Ruey Lee,, Chia-Wen Lin,

Year:

2004

Language:

english

File:

PDF, 314 KB

english, 2004

2

[IEEE International Electron Devices Meeting. Technical Digest - Washington, DC, USA (2-5 Dec. 2001)] International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) - Conventional n-channel MOSFET devices using single layer HfO/sub 2/ and ZrO/sub 2/ as high-k gate dielectrics with polysilicon gate electrode

Yudong Kim,, Gebara, G., Freiler, M., Barnett, J., Riley, D., Chen, J., Torres, K., JaeEun Lim,, Foran, B., Shaapur, F., Agarwal, A., Lysaght, P., Brown, G.A., Young, C., Borthakur, S., Hong-Jyh Li,

Year:

2001

Language:

english

File:

PDF, 479 KB

english, 2001

3

En bloc resection for extensive hepatocellular carcinoma: Is it advisable?

Kuo-Shyang Jeng, Bee-Fong Chen, Hong-Jyh Lin

Journal:

World Journal of Surgery

Year:

1994

Language:

english

File:

PDF, 1.46 MB

english, 1994

4

Coding the chaos in a semiconductor diode for information transmission

Hong-Jyh Li, Jyh-Long Chern

Journal:

Physics Letters A

Year:

1995

Language:

english

File:

PDF, 372 KB

english, 1995

5

Pharmacogenetic study of pruritus induced by epidural morphine for post cesarean section analgesia

Kung, Chia-Chi, Chen, Shiou-Sheng, Yang, Hong-Jyh, Lai, Chih-Jun, Chen, Li-Kuei

Journal:

Taiwanese Journal of Obstetrics and Gynecology

Year:

2018

Language:

english

File:

PDF, 373 KB

english, 2018

6

B Diffusion in Low Energy B/BF2 Implants with Pre-Amorphization of Different Species

Li, Hong-Jyh, Rhoad, Todd, Zeitzoff, Peter, Tichy, Robin, Larson, Larry, Banerjee, Sanjay

Journal:

MRS Proceedings

Year:

2003

Language:

english

File:

PDF, 112 KB

english, 2003

7

[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Boron diffusion and activation in the presence of other species

Hong-Jyh Li,, Kohli, P., Ganguly, S., Kirichenko, T.A., Zeitzoff, P., Torres, K., Banerjee, S.

Year:

2000

Language:

english

File:

PDF, 418 KB

english, 2000

8

Dopant Diffusion Simulation in Thin-SOI

Li, Hong-Jyh, Tichy, Robin, Ross, Jonathon, Gelpey, Jeff, Stotts, Ben, Galloway, Heather

Journal:

MRS Proceedings

Year:

2003

Language:

english

File:

PDF, 125 KB

english, 2003

9

Prospective observational pharmacogenetic study of side effects induced by intravenous morphine for postoperative analgesia

Chen, Li-Kuei, Wang, Mao-Hsien, Yang, Hong-Jyh, Fan, Shou-Zen, Chen, Shiou-Sheng

Journal:

Medicine (Medicine Publishing Company Ltd)

Year:

2017

Language:

english

File:

PDF, 196 KB

english, 2017

10

[IEEE Extended Abstracts of International Workshop on Gate Insulator - Toyko, Japan (2003.11.6-2003.11.7)] Extended Abstracts of International Workshop on Gate Insulator (IEEE Cat. No.03EX765) - EOT scaling and device issues for high-k gate dielectrics

Gardner, M.I., Gopalan, S., Gutt, J., Peterson, J., Hong-Jyh Li,, Huff, H.R.

Year:

2003

Language:

english

File:

PDF, 277 KB

english, 2003

11

Dual high-/spl kappa/ gate dielectric with poly gate electrode: HfSiON on nMOS and Al/sub 2/O/sub 3/ capping layer on pMOS

Hong-Jyh Li,, Gardner, M.I.

Journal:

IEEE Electron Device Letters

Year:

2005

Language:

english

File:

PDF, 181 KB

english, 2005

12

Comparison of low energy BF[sub 2][sup +], BCl[sub 2][sup +], and BBr[sub 2][sup +] implants for the fabrication of ultrashallow P[sup +]-N junctions

Ganguly, Swaroop, Lin, Li, Kohli, Puneet, Li, Hong-Jyh, Kirichenko, Taras, Srinivasa, Raghu, Agarwal, Vikas, Banerjee, Sanjay

Journal:

Journal of Applied Physics

Year:

2002

Language:

english

File:

PDF, 343 KB

english, 2002

13

[IEEE 2005 IEEE International Integrated Reliability Workshop - S. Lake Tahoe, CA, USA (17-20 Oct. 2005)] 2005 IEEE International Integrated Reliability Workshop - Charge Trapping Dependence on the Physical Structure of Ultra-thin ALD-HfSiON/TiN Gate Stacks

Krishnan, S.A., Quevedo-Lopez, M.A., Rino Choi,, Kirsch, P.D., Young, C., Harris, R., Peterson, J.J., Hong-Jyh Li,, Byoung Hun Lee,, Lee, J.C.

Year:

2005

Language:

english

File:

PDF, 421 KB

english, 2005

14

The Pile-Ups Of Aluminum And Boron In The Sige(C)

Li, Hong-Jyh, Onsongo, David, Kirichenko, Taras A., Kohliand, Puneet, Banerjee, Sanjay K.

Journal:

MRS Proceedings

Year:

2002

Language:

english

File:

PDF, 122 KB

english, 2002

15

NPS MODEL PARAMETER UNCERTAINTY ANALYSIS FOR AN OFF-STREAM RESERVOIR

Jehng-Jung Kao, Hong-Jyh Hong

Journal:

JAWRA Journal of the American Water Resources Association

Year:

1996

Language:

english

File:

PDF, 281 KB

english, 1996

16

Boron diffusion in silicon in the presence of other species

Li, Hong-Jyh, Kohli, Puneet, Ganguly, Swaroop, Kirichenko, Taras A., Banerjee, Sanjay, Zeitzoff, Peter

Journal:

Applied Physics Letters

Year:

2000

Language:

english

File:

PDF, 314 KB

english, 2000

17

Subnanometer Scaling of HfO[sub 2]/Metal Electrode Gate Stacks

Peterson, Jeff J., Young, Chadwin D., Barnett, Joel, Gopalan, Sundar, Gutt, Jim, Lee, Choong-Ho, Li, Hong-Jyh, Hou, Tuo-Hung, Kim, Yudong, Lim, Chan

Journal:

Electrochemical and Solid-State Letters

Year:

2004

Language:

english

File:

PDF, 691 KB

english, 2004

18

Hafnium titanate as a high permittivity gate insulator: Electrical and physical characteristics and thermodynamic stability

Li, Min, Zhang, Zhihong, Campbell, Stephen A., Li, Hong-Jyh, Peterson, Jeff J.

Journal:

Journal of Applied Physics

Year:

2007

Language:

english

File:

PDF, 1.57 MB

english, 2007

19

Identification of sub-band-gap absorption features at the HfO[sub 2]âSi(100) interface via spectroscopic ellipsometry

Price, J., Lysaght, P. S., Song, S. C., Li, Hong-Jyh, Diebold, A. C.

Journal:

Applied Physics Letters

Year:

2007

Language:

english

File:

PDF, 451 KB

english, 2007

20

Boron retarded diffusion in the presence of indium or germanium

Hong-Jyh Li,, Kirichenko, T.A., Kohli, P., Banerjee, S.K., Graetz, E., Tichy, R., Zeitzoff, P.

Journal:

IEEE Electron Device Letters

Year:

2002

Language:

english

File:

PDF, 378 KB

english, 2002

21

Polymorphism of μ -Opioid Receptor Gene (OPRM1:c.118A>G) Might Not Protect against or Enhance Morphine-Induced Nausea or Vomiting

Chen, Li-Kuei, Chen, Shiou-Sheng, Huang, Chi-Hsiang, Yang, Hong-Jyh, Lin, Chen-Jung, Chien, Kuo-Liong, Fan, Shou-Zen

Journal:

Pain Research and Treatment

Year:

2013

Language:

english

File:

PDF, 522 KB

english, 2013

22

[IEEE SCS 2003 International Symposium on Signals Circuits and Systems Proceedings (Cat No 03EX720) IIT-02 - Taos, New Mexico, USA (2002.09.27-2002.09.27)] SCS 2003 International Symposium on Signals Circuits and Systems Proceedings (Cat No 03EX720) IIT-02 - Boron retarded diffusion in the presence of indium or germanium

Hong-Jyh Li,, Kirichenko,, Kohli,, Banerjee,, Graetz,, Tichy,, Zeitzoff,

Year:

2002

Language:

english

File:

PDF, 544 KB

english, 2002

23

Searching periodic orbits with a modulation based on Shannon entropy

Li, Hong-Jyh, Chern, Jyh-Long

Journal:

Physical Review E

Year:

1995

File:

PDF, 1.01 MB

1995

24

High permittivity quaternary metal (HfTaTiO[sub x]) oxide layer as an alternative high-κ gate dielectric

Li, Hong-Jyh, Price, J., Gardner, Mark, Lu, Nan, Kwong, Dim-Lee

Journal:

Applied Physics Letters

Year:

2006

Language:

english

File:

PDF, 439 KB

english, 2006

25

Indium out-diffusion from silicon during rapid thermal annealing

Hong-Jyh Li,, Bennett, J., Zeitzoff, P., Kirichenko, T.A., Banerjee, S.K., Henke, D.

Journal:

IEEE Electron Device Letters

Year:

2003

Language:

english

File:

PDF, 248 KB

english, 2003

26

Goal-oriented scheme for taming chaos with a weak periodic perturbation: Experiment in a diode resonator

Li, Hong-Jyh, Chern, Jyh-Long

Journal:

Physical Review E

Year:

1996

Language:

english

File:

PDF, 129 KB

english, 1996

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